Title :
A modular design and test approach for a family of VLSI MPUs
Author :
Braune, D. ; Guerin, Alexandre ; Lebrousse, J.
Author_Institution :
International Microelectronic Support Center, Fontenay Aux Roses, France
Abstract :
Processors based on a commercial CPU integrated with supporting modules will be described. A handcrafted optimization of the core and semi-custom design of the on-chip modules will be detailed.
Keywords :
Assembly; Automatic control; Circuit testing; Design methodology; Design optimization; Integrated circuit testing; Silicon; Test pattern generators; Time factors; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1987 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1987.1157227
