Title :
Wavelet based residual evaluation for fault detection and isolation
Author :
Kabbaj, N. ; Doncescu, A. ; Dahhou, B. ; Roux, G.
Author_Institution :
LBB, CNRS, Toulouse, France
Abstract :
Fault detection and isolation (FDI) is an important issue for safe operation in industrial processes. To avoid false alarms, the FDI scheme must be robust enough to handle all unknown input that might confuse the fault detection system. The aim objective of this work is to use wavelets to increase the robustness of residuals to measurement noise. Our approach is tested in simulation on an alcoholic fermentation process. The faults are modelled as changes in the system parameters and residuals are generated using a set of adaptive observers.
Keywords :
brewing industry; fault diagnosis; fermentation; observers; parameter estimation; process control; wavelet transforms; adaptive observers; alcoholic fermentation; fault detection; fault isolation; multiresolution analysis; parameter estimation; process control; wavelet transform; Alcoholism; Fault detection; Filters; Intelligent sensors; Noise measurement; Noise robustness; System performance; Testing; Wavelet transforms; White noise;
Conference_Titel :
Intelligent Control, 2002. Proceedings of the 2002 IEEE International Symposium on
Print_ISBN :
0-7803-7620-X
DOI :
10.1109/ISIC.2002.1157789