Title :
Teaching design of experiments and statistical analysis of data through laboratory experiments
Author :
Gleixner, Stacy ; Young, Greg ; Vanasupa, Linda ; Dessouky, Yasser ; Allen, Emily ; Parent, David
Author_Institution :
Dept. of Chem. & Mater. Eng., San Jose State Univ., CA, USA
Abstract :
A new laboratory course at San Jose State University, Advanced Thin Film Processes, integrates fabrication of thin films with design of experiment and statistical analysis of data. In the laboratory section of this course, students work through six multi-week modules that increase in the complexity of design of experiment and statistical analysis of data. The six modules have been developed with a standard format that includes learning objectives, background on the specific thin film process, theory of design of experiment principles, instructor notes, dry lab exercises, experimental plan worksheets, and assessment tools. While the modules were developed for a semiconductor processing class, they can easily be implemented in other engineering classes. The modules have been developed with a robust framework that allows the instructor to teach design of experiments and statistical analysis of data along with the specific engineering principles related to their class.
Keywords :
design of experiments; semiconductor technology; semiconductor thin films; student experiments; teaching; Advanced Thin Film Processes; San Jose State University; assessment tools; data analysis; design of experiments teaching; dry lab exercises; engineering classes; engineering principles; experimental plan worksheets; instructor notes; laboratory experiments; learning objectives; multi-week modules; semiconductor processing class; standard format; statistical analysis; thin film process; thin films fabrication; Data engineering; Education; Fabrication; Laboratories; Process design; Robustness; Semiconductor thin films; Standards development; Statistical analysis; Transistors;
Conference_Titel :
Frontiers in Education, 2002. FIE 2002. 32nd Annual
Print_ISBN :
0-7803-7444-4
DOI :
10.1109/FIE.2002.1157932