Title :
A remote access to engineering test facilities for the distant education of European microelectronics students
Author :
Bertrand, Yves ; Flottes, Marie-Lise ; Azaïs, Florence ; Bernard, Serge ; Latorre, Laurent ; Lorival, Régis
Author_Institution :
Centre de Ressources de Test du CNFM, CRTC, Montpellier, France
Abstract :
The European network for integrated circuit testing education described in this paper addresses the shortage of skill in mixed-signal production testing by encouraging students at pre- and post-doctoral levels to attend innovative training courses in the field, jointly supported by industry. The objective of the present educational experience is to strengthen given leading educational centers in Europe, in the critical field of mixed-signal testing, with the active support and guidance of industry. The project is an expansion of the successful French experience on engineering test education which allows any distant student to have a remote access to one-and one only-test resource center equipped with up-to-date/high-tech testers.
Keywords :
distance learning; electronic engineering education; integrated circuit testing; mixed analogue-digital integrated circuits; test facilities; French experience; IC testing education; distant student; educational centers; educational experience; engineering test education; innovative training courses; integrated circuit testing education; mixed-signal production testing; post-doctoral students; pre-doctoral students; remote access; remote access labs; test resource center; Automatic testing; Circuit testing; Costs; Design engineering; Educational products; Europe; Knowledge engineering; Microelectronics; Production; Test facilities;
Conference_Titel :
Frontiers in Education, 2002. FIE 2002. 32nd Annual
Print_ISBN :
0-7803-7444-4
DOI :
10.1109/FIE.2002.1157943
