Title :
In situ measurement of the particle linear energy transfer using the sensitive junctions of the device under test
Author :
Reed, Robert A. ; Roth, David R. ; Ladbury, Ray ; Kniffin, Scott ; LaBel, Ken
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We describe an approach for using charge collection measurement techniques to determine the LET of a particle that reaches the sensitive region with an unknown energy. The method requires that a calibration of the response of the sensitive region to particle LET be established. Then from this calibration, the unknown LET can be determined. We also give recommendation on how to use complex charge collection data to determine the distribution of particle LET reaching the sensitive region and how to correct the particle fluence for this distribution.
Keywords :
energy loss of particles; radiation hardening (electronics); semiconductor counters; charge collection measurement techniques; particle fluence; particle linear energy transfer; sensitive junctions; Calibration; Energy exchange; Energy measurement; Measurement techniques; Microelectronics; NASA; Packaging; Particle measurements; Plastics; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
DOI :
10.1109/RADECS.2001.1159252