Evaluation of a design methodology dedicated to dose rate hardened linear integrated circuits

Author

Deval, Y. ; Lapuyade, H. ; Fouillat, P. ; Barnaby, H. ; Darracq, F. ; Briand, R. ; Lewis, D. ; Schrimpf, R.D.

Author_Institution

IXL, Bordeaux I Univ., Talence, France

fYear

2001

fDate

10-14 Sept. 2001

Firstpage

237

Lastpage

242

Abstract

A design methodology to harden linear integrated circuits with respect to high dose-rate effects is presented. It takes into account the photocurrents induced within the substrate which are responsible for the major degradation of the electrical response of the circuits. This noninvasive approach can be applied to any electronic function. Laser irradiation is used to validate the technique, so that very high level of dose rates can be experimentally simulated.

Keywords

integrated circuit design; integrated circuit modelling; photoconductivity; radiation hardening (electronics); design methodology; dose rate hardened linear integrated circuits; electrical response degradation; electronic function; laser irradiation; photocurrents; Analog integrated circuits; Application specific integrated circuits; Bipolar transistor circuits; Circuit simulation; Degradation; Design methodology; Nuclear electronics; Nuclear power generation; Photoconductivity; Substrates;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on

Print_ISBN

0-7803-7313-8

Type

conf

DOI

10.1109/RADECS.2001.1159286

Filename

1159286