DocumentCode
387635
Title
A delay metric for RC circuits based on the Weibull distribution
Author
Liu, F. ; Kashyap, C. ; Alpert, C.J.
Author_Institution
IBM Austin, TX, USA
fYear
2002
fDate
10-14 Nov. 2002
Firstpage
620
Lastpage
624
Abstract
Physical design optimizations such as placement, interconnect synthesis, floorplanning, and routing require fast and accurate analysis of RC networks. Because of its simple close form and fast evaluation, the Elmore delay metric has been widely adopted. The recently proposed delay metrics PRIMO and H-gamma match the first three circuit moments to the probability density function of a gamma statistical distribution. Although these methods demonstrate impressive accuracy compared to other delay metrics, their implementations tend to be challenging. As an alternative to matching to the gamma distribution, we propose to match the first two circuit moments to a Weibull distribution. The result is a new delay metric called Weibull based Delay (WED). The primary advantages of WED over PRIMO and H-gamma are its efficiency and ease of implementation. Experiments show that WED is robust and has satisfactory accuracies at both near- and far-end nodes.
Keywords
RC circuits; Weibull distribution; circuit layout CAD; delay estimation; integrated circuit layout; network routing; RC networks; Weibull based delay metric; Weibull distribution; circuit moments; design optimizations; floorplanning; interconnect synthesis; placement; probability density function; probability moments; routing; Circuit synthesis; Delay; Design optimization; Integrated circuit interconnections; Network synthesis; Probability density function; Robustness; Routing; Statistical distributions; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
ISSN
1092-3152
Print_ISBN
0-7803-7607-2
Type
conf
DOI
10.1109/ICCAD.2002.1167597
Filename
1167597
Link To Document