DocumentCode
387642
Title
ATPG-based logic synthesis: an overview
Author
Chih-Wei Jim Chang ; Marek-Sadowska, M.
Author_Institution
Cadence Design Syst. Inc., San Jose, CA, USA
fYear
2002
fDate
10-14 Nov. 2002
Firstpage
786
Lastpage
789
Abstract
The ultimate goal of logic synthesis is to explore implementation flexibility toward meeting design targets, such as area, power, and delay. Traditionally, such flexibility is expressed using "don\´t cares" and we seek the best implementation that does not violate them. However, the calculation and storing of don\´t care information is CPU and memory-intensive. In this paper, we give an overview of logic synthesis approaches based on techniques developed for Automatic Test Pattern Generation (ATPG). Instead of calculating and storing don\´t cares explicitly, ATPG-based logic synthesis techniques calculate the flexibility implicitly. Low CPU and memory usage make those techniques applicable for practical industrial circuits. Also, the basic ATPG-based logic level operations create predictable, small layout perturbations, making an ideal foundation for efficient physical synthesis. Theoretical results show that an efficient, yet simple add-a-wire-and-remove-a-wire operation covers all possible complex logic transformations.
Keywords
automatic test pattern generation; circuit optimisation; integrated circuit design; logic CAD; redundancy; timing; ATPG-based logic synthesis; Boolean networks; IC design; add-a-wire-and-remove-a-wire operation; complex logic transformations; gate-level Boolean networks; literal minimization; physical synthesis; power optimization; redundancy-addition-and-removal; timing optimization; Automatic test pattern generation; Boolean functions; Central Processing Unit; Circuit synthesis; Circuit testing; Data structures; Integrated circuit synthesis; Logic design; Logic testing; Network synthesis;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
ISSN
1092-3152
Print_ISBN
0-7803-7607-2
Type
conf
DOI
10.1109/ICCAD.2002.1167621
Filename
1167621
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