• DocumentCode
    387642
  • Title

    ATPG-based logic synthesis: an overview

  • Author

    Chih-Wei Jim Chang ; Marek-Sadowska, M.

  • Author_Institution
    Cadence Design Syst. Inc., San Jose, CA, USA
  • fYear
    2002
  • fDate
    10-14 Nov. 2002
  • Firstpage
    786
  • Lastpage
    789
  • Abstract
    The ultimate goal of logic synthesis is to explore implementation flexibility toward meeting design targets, such as area, power, and delay. Traditionally, such flexibility is expressed using "don\´t cares" and we seek the best implementation that does not violate them. However, the calculation and storing of don\´t care information is CPU and memory-intensive. In this paper, we give an overview of logic synthesis approaches based on techniques developed for Automatic Test Pattern Generation (ATPG). Instead of calculating and storing don\´t cares explicitly, ATPG-based logic synthesis techniques calculate the flexibility implicitly. Low CPU and memory usage make those techniques applicable for practical industrial circuits. Also, the basic ATPG-based logic level operations create predictable, small layout perturbations, making an ideal foundation for efficient physical synthesis. Theoretical results show that an efficient, yet simple add-a-wire-and-remove-a-wire operation covers all possible complex logic transformations.
  • Keywords
    automatic test pattern generation; circuit optimisation; integrated circuit design; logic CAD; redundancy; timing; ATPG-based logic synthesis; Boolean networks; IC design; add-a-wire-and-remove-a-wire operation; complex logic transformations; gate-level Boolean networks; literal minimization; physical synthesis; power optimization; redundancy-addition-and-removal; timing optimization; Automatic test pattern generation; Boolean functions; Central Processing Unit; Circuit synthesis; Circuit testing; Data structures; Integrated circuit synthesis; Logic design; Logic testing; Network synthesis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2002. ICCAD 2002. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-7803-7607-2
  • Type

    conf

  • DOI
    10.1109/ICCAD.2002.1167621
  • Filename
    1167621