DocumentCode :
38798
Title :
Impact of Frequency-Dependent and Nonlinear Parameters on Transient Analysis of Through Silicon Vias Equivalent Circuit
Author :
Piersanti, Stefano ; de Paulis, Francesco ; Orlandi, Antonio ; Jun Fan
Author_Institution :
Dept. of Ind. & Inf. Eng. & Econ., UAq EMC Lab., L´Aquila, Italy
Volume :
57
Issue :
3
fYear :
2015
fDate :
Jun-15
Firstpage :
538
Lastpage :
545
Abstract :
This paper introduces an equivalent circuit model for through silicon vias including the nonlinear effect of metal-oxide-semiconductor capacitance. This nonlinear effect is combined to the frequency-dependent via resistance and inductance, as well as capacitance and conductance of the silicon substrate for a transient analysis. The impact of frequency-dependent RLCG parameters and the nonlinear depletion capacitance on signal propagation, crosstalk and eye diagram is studied using the proposed equivalent circuit model.
Keywords :
MOS integrated circuits; capacitance; crosstalk; equivalent circuits; integrated circuit modelling; three-dimensional integrated circuits; transient analysis; Si; conductance; crosstalk; equivalent circuit model; eye diagram; frequency-dependent RLCG parameters; frequency-dependent parameters; inductance; metal-oxide- semiconductor capacitance; nonlinear depletion capacitance; nonlinear effect; nonlinear parameters; resistance; signal propagation; silicon substrate; silicon vias equivalent circuit; transient analysis; Capacitance; Equivalent circuits; Integrated circuit modeling; Silicon; Substrates; Through-silicon vias; Transient analysis; Crosstalk; equivalent circuit models; frequency-dependent parameters; nonlinear depletion (ND) capacitance; signal integrity; through silicon vias (TSV);
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2015.2391911
Filename :
7024126
Link To Document :
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