Efficient analysis of dielectric-covered waveguide longitudinal slots using analytical transform technique

In order to analyze dielectric-covered waveguide slot arrays, the performance of each element has to be studied with the presence of the dielectric substrate explicitly taken into account. An efficient method for the analysis of dielectric-covered waveguide slots is presented. An analytical transform is derived for the rooftop expansion and line testing (RELT) to evaluate the asymptotic parts of the admittance matrix elements in the spectral domain. The proposed method is shown to reduce the computation time and to improve the accuracy over the conventional method.