Local transformations of thin BN films under the action of STM probe

Local transformations of mixed cubic/hexagonal BN films under the action of electric field of STM probe have been observed. If a magnitude of voltage pulses U/sub bias/ exceeded a threshold value, the STM action results in a local conducting protrusion with a height of the 10% film thickness, and a lateral size of about the film thickness. The film was peeled off the substrate at high voltages. It was noted that the films exposed to X-rays which shown more elastic properties. Possible mechanism of the observed film transformations is discussed.