DocumentCode :
389167
Title :
Failure of digital IC under the influence of electromagnetic radiation
Author :
Vasiliev, K.B. ; Klyuchnik, A.V. ; Solodov, A.V.
Author_Institution :
Radiotechnical Inst., Acad. of Sci., Moscow, Russia
fYear :
2001
fDate :
14-14 Sept. 2001
Firstpage :
540
Lastpage :
541
Abstract :
The experimental data of digital IC failure under the influence of short pulse electromagnetic irradiation are presented. The energy of IC damage is determined as a function of electromagnetic pulse duration and repetition rate. Experiments have been performed in centimeter and millimeter wave band.
Keywords :
digital integrated circuits; failure analysis; radiation effects; IC damage energy; centimeter wave band; digital IC failure; millimeter wave band; pulse duration; pulse repetition rate; short pulse electromagnetic irradiation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology, 2001. CriMiCo 2001. 11th International Conference on
Conference_Location :
Sevastopol, Crimea, Ukraine
Print_ISBN :
966-7968-00-6
Type :
conf
Filename :
1173961
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=389167
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