Title :
Near-field microwave microscope for investigation of dielectrics
Author :
Zagorodnii, V.V. ; Launets, V.L. ; Oliynyk, V.V.
Author_Institution :
Fac. of Radiophys., Nat. Taras Shevchenko Univ. of Kyiv, Ukraine
Abstract :
Elaboration results for a near-field microwave microscope are presented. The main parameters of the microscope are given. The possibility of its application for investigation of heterogeneous dielectrics and nondestructive quality inspection in the microwave range is assessed. An open-ended coaxial waveguide is used as a probe.
Keywords :
coaxial waveguides; dielectric measurement; inspection; microscopes; microwave measurement; nondestructive testing; probes; dielectrics; heterogeneous dielectrics; microscope parameters; microwave range; near-field microwave microscope; nondestructive quality inspection; open-ended coaxial waveguide probe;
Conference_Titel :
Microwave and Telecommunication Technology, 2001. CriMiCo 2001. 11th International Conference on
Conference_Location :
Sevastopol, Crimea, Ukraine
Print_ISBN :
966-7968-00-6
