Title :
Microwave investigation of ferroelectric bulk and film materials
Author :
Kim, B. ; Jeong, M. ; Baik, S. ; Kazmirenko, V. ; Prokopenko, Y. ; Pereverzeva, L. ; Poplavko, Y.
Author_Institution :
Pohang Inst. of Sci. & Technol., South Korea
Abstract :
A method for measuring microwave properties of bulk and film ferroelectric materials has been developed. Waveguide is partially filled by studied material samples, whose dielectric constant /spl epsiv/ /spl sim/ 10/sup 2/ - 10/sup 3/ and losses tan/spl delta/ /spl sim/ 1-10/sup -3/ can be found from the frequency (f) dependence of S-parameters measured by network analyzer. S/sub 11/(f) or S/sub 21/(f) dependencies should be investigated in dependence on sensitivity. Studied films are deposited onto dielectric substrates, and film-on-substrate "sandwich" is centrally located in the waveguide. Software was elaborated to get this "sandwich" scattering parameters, from which film /spl epsi/ and tan/spl delta/ can be calculated. Proposed method of the film investigation requires no electrode deposition, so film dielectric constant and loss might be obtained at various stages of film processing.
Keywords :
S-parameters; dielectric loss measurement; dielectric-loaded waveguides; ferroelectric materials; ferroelectric thin films; microwave measurement; network analysers; permittivity measurement; S-parameters; dielectric constant; dielectric substrate; ferroelectric bulk material; ferroelectric film; film-on-substrate sandwich; loss angle tangent; microwave measurement; network analyzer; partially filled waveguide;
Conference_Titel :
Microwave and Telecommunication Technology, 2001. CriMiCo 2001. 11th International Conference on
Conference_Location :
Sevastopol, Crimea, Ukraine
Print_ISBN :
966-7968-00-6