Title :
New approach to vision-based BGA package inspection
Author :
Yu, Mei ; Jiang, Gang-Yi ; He, Sai-Long ; Yu, Bo-Kang ; Fu, Ran-Di
Author_Institution :
Inst. of Circuits & Syst., Ningbo Univ., China
Abstract :
Ball grid array (BGA) techniques have developed very fast due to the advantages of more I/O ports, small size, and so on. In this paper, a vision-based algorithm for BGA package inspection is proposed to accurately estimate center and diameters of solder-balls of BGA packages, so that defects of BGA packages, such as missing or extra balls, oversize or undersize balls, over-height or under-height balls, and pitch can be detected for ensuring the quality of BGA packages.
Keywords :
automatic optical inspection; ball grid arrays; computer vision; feature extraction; 2D inspection; 3D inspection; BGA package inspection; ball grid array; defect detection; feature extraction; vision-based algorithm; Cameras; Circuits and systems; Electronics packaging; Helium; Inspection; Laboratories; Packaging machines; Pixel; Sensor systems; X-ray lasers;
Conference_Titel :
Machine Learning and Cybernetics, 2002. Proceedings. 2002 International Conference on
Print_ISBN :
0-7803-7508-4
DOI :
10.1109/ICMLC.2002.1174556