• DocumentCode
    389421
  • Title

    Thermal interaction of semiconductor devices in multi-chip modules

  • Author

    Ayadi, Moez ; Ammous, Anis ; Ounejjar, Youssef ; Sellami, Faycal

  • Author_Institution
    Lab. d´´Electronique et des Technol. de l´´Inf. (LETI), Sfax, Tunisia
  • Volume
    6
  • fYear
    2002
  • fDate
    6-9 Oct. 2002
  • Abstract
    The thermal behavior of power modules is an important criterion for the design of cooling systems and for the optimum thermal structure of these modules. An important consideration for high power and high frequency design are the spacing between semiconductor devices, structure of the substrate and the influence of the boundary condition. In this paper we have studied the thermal behavior of power hybrid module. These devices are composed by one or several chips connected between them.
  • Keywords
    cooling; finite element analysis; multichip modules; thermal management (packaging); thermal resistance; boundary condition; cooling systems; high frequency design; multi-chip modules; optimum thermal structure; power hybrid module; power modules; semiconductor devices; substrate; thermal behavior; thermal interaction; Circuit simulation; Heat sinks; Impedance; Insulated gate bipolar transistors; Numerical simulation; Resistance heating; Semiconductor devices; Substrates; Temperature; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man and Cybernetics, 2002 IEEE International Conference on
  • ISSN
    1062-922X
  • Print_ISBN
    0-7803-7437-1
  • Type

    conf

  • DOI
    10.1109/ICSMC.2002.1175606
  • Filename
    1175606