DocumentCode :
389776
Title :
Signal integrity simulation and analysis in high-speed interconnects by using FDTD
Author :
Er-Ping, Li ; Wei-Liang, Yuan
Author_Institution :
Computational Electromagn. & Electron. Div., Inst. of High Performance Comput., Singapore, Singapore
fYear :
2002
fDate :
21-24 May 2002
Firstpage :
268
Lastpage :
271
Abstract :
With the advancements in microelectronics, interest in electromagnetic interference and compatibility in high-speed circuits has greatly increased in the engineering community, and applications of computational electromagnetics to electromagnetic interference and compatibility (EMI/EMC) engineering become an emerging technology. Termination, via, and crosstalk on interconnection lines will raise EMI problems in high-speed circuits and will therefore require more attention during the design phase for signal integrity. This paper presents signal propagation effect analysis on high-speed interconnection lines, between different parts, with the finite-difference time-domain method. The mechanisms and effectiveness of control measures are examined, which could be applied to high-speed circuit design.
Keywords :
computational electromagnetics; crosstalk; electromagnetic compatibility; electromagnetic interference; finite difference time-domain analysis; interconnections; EMC; EMI control measures; FDTD; computational electromagnetics; crosstalk; electromagnetic compatibility; electromagnetic interference; finite-difference time-domain methods; high-speed interconnects; interconnection line terminations; signal integrity analysis; signal integrity simulation; signal propagation effect analysis; via holes; Analytical models; Circuit simulation; Computational modeling; Electromagnetic compatibility and interference; Electromagnetic interference; Finite difference methods; Integrated circuit interconnections; Microelectronics; Signal analysis; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2002 3rd International Symposium on
Print_ISBN :
0-7803-7277-8
Type :
conf
DOI :
10.1109/ELMAGC.2002.1177422
Filename :
1177422
Link To Document :
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