DocumentCode :
389782
Title :
EMI detection by means of wavelet
Author :
Wu, Wei
Author_Institution :
Dipt. di Elettronica e Inf., Padova Univ., Italy
fYear :
2002
fDate :
21-24 May 2002
Firstpage :
454
Lastpage :
457
Abstract :
This paper proposes a new EMI detection approach. The approach uses a wavelet to analyze various waveforms (generated by CAD or measured by digital oscilloscope) in a particular circuit, identify specialized EMI spectrum distribution in the circuit layout in order to assist removing EMI quickly. An EMI detection application for a DC-DC converter is also offered.
Keywords :
DC-DC power convertors; electromagnetic compatibility; electromagnetic interference; printed circuit layout; waveform analysis; wavelet transforms; DC-DC converter; EMI detection approach; EMI removal; EMI spectrum distribution; PCB; circuit layout; waveform analysis; wavelet; Circuit faults; Circuit testing; Electromagnetic compatibility; Electromagnetic interference; Electronic equipment testing; Frequency measurement; Oscilloscopes; Particle measurements; Wavelet analysis; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2002 3rd International Symposium on
Print_ISBN :
0-7803-7277-8
Type :
conf
DOI :
10.1109/ELMAGC.2002.1177468
Filename :
1177468
Link To Document :
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