• DocumentCode
    389923
  • Title

    Fast service restoration under deregulated environment

  • Author

    Moon, Young-Hyun

  • Author_Institution
    Dept. of Electr. Eng., Yonsei Univ., Seoul, South Korea
  • Volume
    1
  • fYear
    2002
  • fDate
    6-10 Oct. 2002
  • Firstpage
    574
  • Abstract
    The power quality service has been considered to boost the competition in the distribution side, which is necessary to meet the customers´ demands in the near future. Due to increasing demands for the high reliability, the fast service restoration has been a hot issue with the fault tolerable distribution system. In order to ensure high reliability, the scope of service restoration should be extended to severer faults such as multi-feeder outages, bus outages and transformer outages at the substation, and out-of-services of a whole substation. In this panel session, the fast service restoration is discussed with the necessity of developing new approaches to be adapted to the distribution system under deregulation, mainly focusing on fast solution search algorithms, multi-switching strategies for severer fault occurrence, search for the fault section, and fast power flow calculation.
  • Keywords
    distribution networks; electricity supply industry deregulation; load flow; power distribution reliability; power system restoration; power transformers; substations; bus outages; deregulated environment; deregulation; fast power flow calculation; fast service restoration; fault occurrence; fault tolerable distribution system; high reliability; multi-feeder outages; multi-switching strategies; power distribution competition; power quality service; substation; transformer outages; Distributed control; Distributed power generation; Load flow; Moon; Power generation; Power quality; Power system reliability; Power system restoration; Substations; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission and Distribution Conference and Exhibition 2002: Asia Pacific. IEEE/PES
  • Print_ISBN
    0-7803-7525-4
  • Type

    conf

  • DOI
    10.1109/TDC.2002.1178469
  • Filename
    1178469