PCA based programmable path signature analysis in BIST

Author

Chuanwu, Zhang ; Qicong, PENG ; Yubo, Li

Author_Institution

Inst. of Commun. & Inf. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China

Volume

2

fYear

2002

fDate

29 June-1 July 2002

Firstpage

1227

Abstract

A novel approach of programmable cellular automata (PCA) based switch path signature analysis in built-in self-test (BIST) is presented in this paper. By taking account of the biased output bits of the circuit under test (CUT), while computing the aliasing probability, we can obtain a lower bound of the aliasing probability, contrasting with former methods such as linear feedback shift registers (LFSR) and multiple input shift registers (MISR).

Keywords

built-in self test; cellular automata; design for testability; integrated circuit design; integrated circuit testing; logic design; logic testing; BIST switch path signature analysis; CUT; DFT; LFSR; MISR; PCA based programmable path signature analysis; SA; aliasing probability lower bounds; built-in self-test; circuit under test biased output bits; design for test methods; linear feedback shift registers; multiple input shift registers; programmable cellular automata; Automatic testing; Built-in self-test; Circuit testing; Communication switching; Feedback circuits; Linear feedback shift registers; Principal component analysis; Shift registers; Switches; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Communications, Circuits and Systems and West Sino Expositions, IEEE 2002 International Conference on

Print_ISBN

0-7803-7547-5

Type

conf

DOI

10.1109/ICCCAS.2002.1179004

Filename

1179004