DocumentCode :
389975
Title :
Measurement-based characterization method for integrated power electronics modules
Author :
Yang, Liyu ; Lee, F.C. ; Odendaal, W.G.
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume :
1
fYear :
2003
fDate :
9-13 Feb. 2003
Firstpage :
490
Abstract :
A measurement-based method for high frequency characterization of active integrated power electronics modules (IPEMs) is proposed. Parasitic inductances and capacitances inside the IPEM can all be extracted using this method without breaking the structure. The linearized model includes effects of the nonlinear frequency dependencies of resistances and inductances, the structural capacitances and any ground planes. Extracted parameters are compared to those from commercial software and the results are in good agreement. A parallel resonance method is proposed for the characterization of common-mode capacitances.
Keywords :
DC-DC power convertors; capacitance measurement; electric impedance measurement; inductance measurement; instrumentation; power electronics; DC/DC converters; active integrated power electronics modules; commercial software; common-mode capacitances; ground planes; high frequency characterization; inductances; integrated power electronics modules; measurement-based method; nonlinear frequency dependencies; parallel resonance method; parasitic capacitances; parasitic inductances; resistances; structural capacitances; Delta modulation; Electrical resistance measurement; Electromagnetic interference; Electronics packaging; Frequency; Magnetic noise; Parasitic capacitance; Power electronics; Power measurement; Semiconductor device noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2003. APEC '03. Eighteenth Annual IEEE
Conference_Location :
Miami Beach, FL, USA
Print_ISBN :
0-7803-7768-0
Type :
conf
DOI :
10.1109/APEC.2003.1179258
Filename :
1179258
Link To Document :
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