Title :
On the image recovery on a circular domain from noisy data
Author :
Pawlak, Miroslaw ; Liao, Simon X.
Author_Institution :
Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada
Abstract :
We consider the problem of estimating a function f(x, y) on the unit disk {(x, y): x2+y2 ≤ 1}, given discrete and noisy data recorded on a regular square grid. An estimate of f(x, y) based on a class of orthogonal and complete functions over the unit disk is proposed. This class of functions has a distinctive property of being invariant to rotation of axes about the origin of coordinates, yielding, therefore a rotationally invariant and noise resistant reconstruction method. For radial functions, the orthogonal set has a particularly simple form being related to the classical Legendre polynomials. We give a detailed statistical accuracy analysis of the proposed estimate of f(x, y) in the sense of the L2 metric. It is found that there is an inherent limitation in the precision of the estimate due to the geometric nature of a circular domain. This is explained by relating the accuracy issue to the celebrated problem in the analytic number theory called the lattice points of a circle. In fact, the obtained bounds for the mean integrated squared error are determined by the best known result so far on the problem of lattice points within the circular domain.
Keywords :
Legendre polynomials; functions; image reconstruction; mean square error methods; number theory; parameter estimation; pattern recognition; random noise; statistical analysis; L2 metric; Legendre polynomials; analytic number theory; circular domain; complete functions; function estimation; image recovery; invariant pattern recognition; lattice points; mean integrated squared error; noise resistant reconstruction method; noisy data; orthogonal functions; regular square grid; rotationally invariant reconstruction method; statistical accuracy analysis; unit disk; Data analysis; Image analysis; Jacobian matrices; Lattices; Optical devices; Optical diffraction; Pattern analysis; Pattern recognition; Polynomials; Positrons;
Conference_Titel :
Signal Processing, 2002 6th International Conference on
Print_ISBN :
0-7803-7488-6
DOI :
10.1109/ICOSP.2002.1179970