DocumentCode :
390584
Title :
A new accuracy evaluation criterion for binary classifiers
Author :
Xinguang, Peng ; Yushu, Liu ; Tie, Wang ; Yushu, Wu ; Xueli, Yu
Volume :
1
fYear :
2002
fDate :
28-31 Oct. 2002
Firstpage :
57
Abstract :
A new evaluation criterion used for predicting accuracy of binary classifiers for identifying high risk components in software engineering is proposed on the basis of analysis of the presented measure criterions so as to achieve the highest possible prediction accuracy. The proposed evaluation criterion completely eliminates deficiencies of the current criterions, and is independent of the proportion of high risk components in the component set. Many different examples make sure that results of evaluation are assuredly the results of prediction.
Keywords :
object-oriented programming; pattern classification; software engineering; accuracy evaluation criterion; binary classifiers; high risk component identification; software engineering; Accuracy; Classification algorithms; Computer science; Educational institutions; Electronic mail; Independent component analysis; Mechanical engineering; Paper technology; Software engineering; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON '02. Proceedings. 2002 IEEE Region 10 Conference on Computers, Communications, Control and Power Engineering
Print_ISBN :
0-7803-7490-8
Type :
conf
DOI :
10.1109/TENCON.2002.1181213
Filename :
1181213
Link To Document :
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