DocumentCode
39068
Title
Experimental Validation of Topology Optimization for RF MEMS Capacitive Switch Design
Author
Philippine, M.A. ; Zareie, H. ; Sigmund, O. ; Rebeiz, Gabriel M. ; Kenny, Thomas W.
Author_Institution
Mech. Eng. Dept., Stanford Univ., Stanford, CA, USA
Volume
22
Issue
6
fYear
2013
fDate
Dec. 2013
Firstpage
1296
Lastpage
1309
Abstract
In this paper, we present 30 distinct RF MEMS capacitive switch designs that are the product of topology optimizations that control key mechanical properties such as stiffness, response to intrinsic stress gradients, and temperature sensitivity. The designs were evaluated with high-accuracy simulations prior to micro-fabrication. We built and tested more than 170 switches, including at least five per distinct design. Experimental results confirm that the finite element models are accurate and that the switches behave as intended by the different optimizations. Extensive testing results include actuation and release voltages as a function of temperature, switching times, capacitance ratios, fitted S-parameters, and profile measurements during actuation and over temperature. [2013-0203].
Keywords
finite element analysis; microswitches; microwave switches; network topology; optimisation; stress effects; RF MEMS capacitive switch design; S-parameters; actuation; capacitance ratios; finite element models; intrinsic stress gradients; microfabrication; profile measurements; release voltages; stiffness; temperature sensitivity; topology optimization; Optimization; Radio frequency; Stress; Switches; Temperature measurement; Topology; Voltage measurement; RF MEMS; RF switch; Topology optimization; capacitive switch; mechanical design; optimization; stress stiffening; temperature sensitivity;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2013.2283241
Filename
6620954
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