DocumentCode :
39068
Title :
Experimental Validation of Topology Optimization for RF MEMS Capacitive Switch Design
Author :
Philippine, M.A. ; Zareie, H. ; Sigmund, O. ; Rebeiz, Gabriel M. ; Kenny, Thomas W.
Author_Institution :
Mech. Eng. Dept., Stanford Univ., Stanford, CA, USA
Volume :
22
Issue :
6
fYear :
2013
fDate :
Dec. 2013
Firstpage :
1296
Lastpage :
1309
Abstract :
In this paper, we present 30 distinct RF MEMS capacitive switch designs that are the product of topology optimizations that control key mechanical properties such as stiffness, response to intrinsic stress gradients, and temperature sensitivity. The designs were evaluated with high-accuracy simulations prior to micro-fabrication. We built and tested more than 170 switches, including at least five per distinct design. Experimental results confirm that the finite element models are accurate and that the switches behave as intended by the different optimizations. Extensive testing results include actuation and release voltages as a function of temperature, switching times, capacitance ratios, fitted S-parameters, and profile measurements during actuation and over temperature. [2013-0203].
Keywords :
finite element analysis; microswitches; microwave switches; network topology; optimisation; stress effects; RF MEMS capacitive switch design; S-parameters; actuation; capacitance ratios; finite element models; intrinsic stress gradients; microfabrication; profile measurements; release voltages; stiffness; temperature sensitivity; topology optimization; Optimization; Radio frequency; Stress; Switches; Temperature measurement; Topology; Voltage measurement; RF MEMS; RF switch; Topology optimization; capacitive switch; mechanical design; optimization; stress stiffening; temperature sensitivity;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2013.2283241
Filename :
6620954
Link To Document :
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