Title :
On the use of wavelet transforms in testing for the DNL of ADCs
Author :
Marshall, Rion O. ; Akujuobi, Cajetan M.
Author_Institution :
Prairie View A&M Univ., USA
Abstract :
This paper evaluates the use of wavelet transforms in testing for the differential non-linearity (DNL) of ADCs. A MATLAB algorithm is developed to implement the Haar wavelet transform to perform the test. A comparison is then made between the wavelet and the histogram-based tests.
Keywords :
Haar transforms; analogue-digital conversion; circuit simulation; circuit testing; nonlinear network analysis; ADC testing; DNL; Haar wavelet transform; MATLAB; analog-to-digital converter; differential nonlinearity; histogram-based tests; wavelet test; Analog-digital conversion; Circuit testing; Fast Fourier transforms; Frequency; Histograms; MATLAB; Performance evaluation; Signal processing algorithms; Wavelet transforms; Yarn;
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
DOI :
10.1109/MWSCAS.2002.1186788
