Title :
A dynamic element matching approach to ADC testing
Author :
Olleta, Beatriz ; Chen, Degang ; Geiger, Randall
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
A dynamic element matching approach to ADC testing is presented. With this technique a highly nonideal DAC is used to generate an excitation for the DUT. Dynamic element matching is used to create a statically precise excitation from imprecise components. Simulation results show this approach can be used to accurately measure the performance of an ADC. This technique offers potential for use in both production test and BIST environments.
Keywords :
analogue-digital conversion; built-in self test; integrated circuit testing; production testing; ADC performance; ADC testing; BIST environment; INL measurement; dynamic element matching approach; highly nonideal DAC; imprecise components; production test environment; statically precise excitation; Analog-digital conversion; Built-in self-test; Circuit testing; Digital-analog conversion; Linearity; Production; Resistors; Signal resolution; Silicon; Voltage;
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
DOI :
10.1109/MWSCAS.2002.1186920
