Title :
Neural networks applied to automatic fault detection
Author :
Jakubek, Stefan ; Strasser, Thomas
Author_Institution :
Inst. for Machine & Process Autom., Vienna Univ. of Technol., Austria
Abstract :
The objective of this paper is an automatic fault detection scheme for applications in the automotive industry. In order to increase data reliability and for the purpose of monitoring and control of test equipment, a fault detection system based on multivariate data analysis is being developed. The detection scheme has to process up to several hundreds of different measurements at a time and check them for consistency. The main problem lies in the fact that besides the available data, no further information is provided. The chosen approach models the distribution function of available fault-free data using ellipsoidal basis function networks. An important requirement for the fault detection scheme is that it should be able to automatically adapt itself to new data. The present paper is focused on this feature. It is demonstrated how a gradient optimization with algebraic constraints can be applied to adapt a pre-existing network to new data points. Numerical examples with actual data show that the proposed method produces good results.
Keywords :
adaptive systems; data analysis; fault diagnosis; gradient methods; multivariable systems; neural nets; optimisation; radial basis function networks; adaptable detection scheme; automatic fault detection; automotive measuring systems; consistency checking; data reliability; ellipsoidal basis function networks; fault-free data distribution function; gradient optimization; multivariate data analysis; neural networks; optimization algebraic constraints; test equipment control; test equipment monitoring; Automatic control; Automotive engineering; Control systems; Data analysis; Electrical equipment industry; Fault detection; Monitoring; Neural networks; Test equipment; Time measurement;
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
DOI :
10.1109/MWSCAS.2002.1187302