Title :
Fabrication and packaging of inertia micro-switch using metal-electroplating technology
Author :
Ma, Wei ; Li, Gang ; Zohar, Yitshak ; Wong, Man
Author_Institution :
Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., China
Abstract :
Separate and non-interfering photoresist-molded metal-electroplating processes have been applied to the fabrication of inertia micro-switches and their wafer-level packaging in sealed cavities formed using eutectic bonding. The height of a switch and that of its cavity are independently controlled. The low process temperature allows eventual modular integration of switches on active substrates containing pre-fabricated electronic signal-processing circuits. The scheme also provides leads for electrical access to the sealed devices. The switches are based on a lateral mechanical resonator design responding to inertia change above a pre-determined threshold value. A simple but accurate lumped spring-mass model is developed based on analytical and numerical studies. Predictions of the behavior of switches with different geometric designs have been verified using both drop-hammer and shaker tests. Switches making over 100 million contacts have been demonstrated in room ambient.
Keywords :
electroplating; mechanical testing; micromachining; micromechanical resonators; microswitches; photoresists; semiconductor device models; semiconductor device packaging; semiconductor device testing; active substrates; drop-hammer tests; electrical access leads; eutectic bonding; inertia change; inertia micro-switches; inertia threshold value; lateral mechanical resonator design; lumped spring-mass model; modular integration; noninterfering photoresist-molded metal-electroplating processes; numerical studies; pre-fabricated electronic signal-processing circuits; process temperature; sealed cavities; sealed devices; shaker tests; switch cavity; switch contacts; switch geometric designs; switch height; wafer-level packaging; Fabrication; Microswitches; Packaging; Signal processing; Switches; Switching circuits; Temperature; Testing; Wafer bonding; Wafer scale integration;
Conference_Titel :
Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE The Sixteenth Annual International Conference on
Print_ISBN :
0-7803-7744-3
DOI :
10.1109/MEMSYS.2003.1189823