DocumentCode :
392625
Title :
Enhanced near IR absorption in random, RIE-textured silicon solar cells: the role of surface profiles
Author :
Zaidi, Saleem H. ; Ruby, Douglas S. ; DeZetter, Karen ; Gee, James M.
Author_Institution :
Gratings Inc., Albuquerque, NM, USA
fYear :
2002
fDate :
19-24 May 2002
Firstpage :
142
Lastpage :
145
Abstract :
We report on the role of surface profiles exhibiting comparable reflectance in random reactive ion etched textured Si solar cells. Internal quantum efficiency measurements demonstrate significant near IR absorption enhancement with peaks at λ ∼ 1120 nm and 1050 nm. Using Fourier analysis of random surfaces, we find a majority of spatial structures in ∼ 0.3-5-μm range. This random distribution of subwavelength periodic structures leads to enhanced oblique coupling into Si through diffractive optics mechanisms. The random surfaces supporting finer features create diffraction orders propagating at larger angles enhancing near IR absorption through oblique light propagation. Random surfaces with larger features create almost vertically propagating diffraction orders resulting in little oblique coupling, and for some structures, almost no enhanced near IR absorption.
Keywords :
Fourier analysis; diffraction gratings; elemental semiconductors; infrared spectra; reflectivity; silicon; solar cells; sputter etching; surface texture; Fourier analysis; Si; diffractive optics mechanisms; internal quantum efficiency; near IR absorption; random RIE-textured silicon solar cells; reflectance; surface profiles; Electromagnetic wave absorption; Etching; Optical coupling; Optical diffraction; Optical propagation; Periodic structures; Photovoltaic cells; Reflectivity; Silicon; Surface texture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN :
1060-8371
Print_ISBN :
0-7803-7471-1
Type :
conf
DOI :
10.1109/PVSC.2002.1190476
Filename :
1190476
Link To Document :
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