• DocumentCode
    392666
  • Title

    Polycrystalline silicon on glass by aluminum-induced crystallization

  • Author

    Gall, S. ; Muske, M. ; Sieber, I. ; Schneider, J. ; Nast, O. ; Fuhs, W.

  • Author_Institution
    Hahn-Meitner-Inst., Berlin, Germany
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    1202
  • Lastpage
    1205
  • Abstract
    We prepared thin polycrystalline silicon (poly-Si) films on glass by an aluminum-induced layer exchange (ALILE) process which is based on the aluminum-induced crystallization (AlC) of amorphous silicon (a-Si). During the ALILE process a glass/Al/a-Si stack is transformed into a glass/poly-Si/Al+Si structure. We investigated both the growth of the poly-Si layer and the final Al+Si layer on top of the poly-Si layer. Furthermore, we carried out the ALILE process on large glass substrates and on metal-coated glass substrates.
  • Keywords
    aluminium; amorphous semiconductors; crystallisation; elemental semiconductors; glass; semiconductor thin films; silicon; solar cells; ALILE process; SiO2-Si-Si:Al; aluminum-induced crystallization; aluminum-induced layer exchange process; amorphous silicon; glass; poly-Si film; polycrystalline silicon; Amorphous silicon; Annealing; Artificial intelligence; Crystallization; Glass; Optical films; Optical microscopy; Photovoltaic cells; Scanning electron microscopy; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190823
  • Filename
    1190823