DocumentCode :
3928
Title :
Quantum Transport in AlGaSb/InAs TFETs With Gate Field In-Line With Tunneling Direction
Author :
Zhengping Jiang ; Yeqing Lu ; Yaohua Tan ; Yu He ; Povolotskyi, Michael ; Kubis, Tillmann ; Seabaugh, Alan C. ; Fay, Patrick ; Klimeck, Gerhard
Author_Institution :
Network for Comput. Nanotechnol., Purdue Univ., West Lafayette, IN, USA
Volume :
62
Issue :
8
fYear :
2015
fDate :
Aug. 2015
Firstpage :
2445
Lastpage :
2449
Abstract :
Quantum transport simulations are performed in tunneling FETs (TFETs) with the gate electric field in-line with the tunneling junction direction (in-line TFETs). Charge self-consistency and thermalization effects are included in a semiclassical Poisson solution to compute the electrostatic potential. The obtained potential is then used for current calculation with the ballistic nonequilibrium Green´s function method (NEGF) in the tight binding basis. It is shown that the NEGF method predicts a higher subthreshold swing than the often-used dynamic nonlocal (DNL) path band-to-band method. The NEGF method accounts for the direct source-drain tunneling, which is underestimated in the DNL path approach in the studied geometries. Undercut is shown to be essential to obtain switching slope below 60 mV/decade in the in-line TFETs.
Keywords :
Green´s function methods; III-V semiconductors; Poisson equation; aluminium compounds; electric fields; field effect transistors; gallium compounds; indium compounds; tunnel transistors; AlGaSb-InAs; NEGF method; TFET; band-to-band method; charge self-consistency; dynamic nonlocal path; electrostatic potential; gate electric field; nonequilibrium Greens function method; quantum transport simulation; semiclassical Poisson solution; source-drain tunneling; thermalization effects; tunneling FET; tunneling junction direction; Doping; Electric potential; Electrical engineering; Geometry; Junctions; Logic gates; Tunneling; Atomistic simulation; steep subthreshold swing; tight binding; tunneling FETs (TFETs); tunneling FETs (TFETs).;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2015.2443564
Filename :
7150378
Link To Document :
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