DocumentCode :
39284
Title :
Partial Access Mode: New Method for Reducing Power Consumption of Dynamic Random Access Memory
Author :
Riho, Yoshiro ; Nakazato, Kazuo
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Nagoya Univ., Nagoya, Japan
Volume :
22
Issue :
7
fYear :
2014
fDate :
Jul-14
Firstpage :
1461
Lastpage :
1469
Abstract :
Demands have been placed on a dynamic random access memory (DRAM) to not only have increased memory capacity and data transfer speed, but also have reduced operating and standby currents. When a system uses a DRAM, a refresh operation is necessary because of its data retention time restriction: each bit of the DRAM is stored as an amount of electrical charge in a storage capacitor that is discharged by the leakage current. Power consumption for the refresh operation increases in proportion to the memory capacity. We propose a new method to reduce the refresh power consumption by effectively extending the memory cell retention time. Conversion from 1 cell/bit to 2N cells/bit reduces the variation in the retention time among memory cells. Although active power increases by a factor of 2N, the refresh time increases by more than 2N as a consequence of the fact that the majority decision does better than averaging for the tail distribution of retention time. The conversion can be realized very simply from the structure of the DRAM array circuit, and it reduces the frequency of disturbance and power consumption by two orders of magnitude. On the basis of this conversion method, we propose a partial access mode to reduce power consumption dynamically when the full memory capacity is not required.
Keywords :
DRAM chips; leakage currents; power consumption; DRAM array circuit; data retention time restriction; data transfer speed; dynamic random access memory; electrical charge; leakage current; memory capacity; memory cell retention time; memory cells; partial access mode; power consumption reduction; storage capacitor; Arrays; Leakage currents; Memory management; Microprocessors; Power demand; Random access memory; Composed dynamic random access memory (DRAM) cell; data retention time; low-power DRAM; mobile DRAM; partial access mode (PAM); partial array self refresh; partial array self refresh.;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2013.2272043
Filename :
6620974
Link To Document :
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