DocumentCode
393187
Title
Oriented lithium niobate layers transferred on 4" [100] silicon wafer for RF SAW devices
Author
Solal, M. ; Pastureaud, Th ; Ballandras, S. ; Aspar, B. ; Biasse, B. ; Daniau, W. ; Hodé, J.M. ; Calisti, S. ; Laude, V.
Volume
1
fYear
2002
fDate
8-11 Oct. 2002
Firstpage
131
Abstract
A technological process has been developed to achieve a thin oriented Lithium Niobate layer deposited on [100] Si wafers for the fabrication of SAW devices integrable on silicon. The theoretical analysis of the elastic wave assumed to propagate on such combination of material is first reported. Technological aspects are then briefly described. Finally, experimental results are presented and compared to the state of art.
Keywords
elemental semiconductors; lithium compounds; piezoelectric materials; silicon; surface acoustic wave filters; 4 in; 4" [100] Si wafer; LiNbO3; RF SAW devices; Si; elastic wave; oriented lithium niobate layers; Fabrication; Green\´s function methods; Lithium niobate; Piezoelectric films; Propagation losses; Radio frequency; Silicon; Substrates; Surface acoustic wave devices; Surface acoustic waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
ISSN
1051-0117
Print_ISBN
0-7803-7582-3
Type
conf
DOI
10.1109/ULTSYM.2002.1193369
Filename
1193369
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