Title : 
Investigation of two-level split finger transducers
         
        
            Author : 
Sato, Takahiro ; Kwon, Jong Oh ; Song, Jin Baek ; Park, Jang Ho ; Kimura, Noritoshi
         
        
            Author_Institution : 
Samsung Yokohama Res. Inst., Kanagawa, Japan
         
        
        
        
        
        
            Abstract : 
Unidirectional characteristics of two-level split finger transducers are calculated as functions of the structure parameters, for several electrode materials (Al, Cu, Au etc.) on ST-X quartz, by using a method based on boundary integral equations for the grating structure. The calculation results show that the two-level structures have sufficiently large reflectivity by choosing the electrode materials and modifying the structure parameters. Moreover, 190 MHz range two-level structure filters are fabricated by using high accurate mask alignment techniques with a position error of 50nm. The experiments show a good agreement with the calculations. It is found that the two-level split finger transducers have a larger transduction coefficient and a high reflectivity, compared with other SPUDTs such as a distributed acoustic reflection transducer (DART) or an electrode width control (EWC) SPUDT. It is therefore possible to reduce an insertion loss of the SPUDT filters.
         
        
            Keywords : 
boundary integral equations; interdigital transducers; surface acoustic wave filters; surface acoustic wave transducers; 190 MHz; 50 nm; SPUDT filters; SiO2; boundary integral equations; distributed acoustic reflection transducer; grating structure; high accurate mask alignment techniques; high reflectivity; insertion loss; large reflectivity; larger transduction coefficient; position error; structure parameters; two-level split finger transducers; two-level structures; Acoustic reflection; Acoustic transducers; Electrodes; Filters; Fingers; Gold; Gratings; Insertion loss; Integral equations; Reflectivity;
         
        
        
        
            Conference_Titel : 
Ultrasonics Symposium, 2002. Proceedings. 2002 IEEE
         
        
        
            Print_ISBN : 
0-7803-7582-3
         
        
        
            DOI : 
10.1109/ULTSYM.2002.1193418