DocumentCode
393341
Title
On the performance of compact thermal models of electronic chip packages in conjugate board level simulation
Author
DeVoe, Jason ; Ortega, Alfonso ; Berhe, Mulugeta
Author_Institution
Dept. of Aerosp. & Mech. Eng., Arizona Univ., Tucson, AZ, USA
fYear
2003
fDate
11-13 March 2003
Firstpage
313
Lastpage
318
Abstract
This study seeks to introduce a true conjugate solution methodology for compact thermal models of electronic packages in board level simulations using a computational fluid dynamic (CFD)/computational heat transfer (CHT) approach. CTM models were created for a BGA and CPGA based on thermal response data obtained by applying a set of non-redundant boundary condition sets to a fully-detailed model of each package. For consistency, the data was generated using the computational fluid dynamics tool IcePak™ run in a non-conjugate mode. Smeared models of the JEDEC standard printed circuit board for each package were created within the conjugate environment. The conductivities of these boards were ranged between three orders of magnitude. The fully-detailed model of each package were evaluated on these boards and in an unmounted state. The air velocity was varied for each between 1.0, 2.5, and 5.0 [m/s]. The fully-detailed model was replaced with the derived CTM and tested under similar conditions. Secondary sources were also investigate on elongated PCBs. The location of the source on the board was varied between three locations upstream of the package. The resultant junction temperature prediction of each setup was then compared.
Keywords
ball grid arrays; circuit simulation; computational fluid dynamics; heat transfer; integrated circuit modelling; printed circuits; thermal conductivity; thermal management (packaging); 1.0 m/s; 2.5 m/s; 5.0 m/s; BGA; CFD; CHT; CPGA; PCB thermal conductivity; air velocity; computational fluid dynamics; computational heat transfer; conjugate board level simulation; electronic chip package compact thermal models; elongated PCB; junction temperature prediction; nonredundant boundary condition sets; thermal response; Aerospace simulation; Boundary conditions; Computational fluid dynamics; Electronic packaging thermal management; Electronics packaging; Heat transfer; Solid modeling; Temperature; Testing; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2003. Ninteenth Annual IEEE
ISSN
1065-2221
Print_ISBN
0-7803-7793-1
Type
conf
DOI
10.1109/STHERM.2003.1194378
Filename
1194378
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