DocumentCode
393342
Title
2003 cumulative bibliography of articles on semiconductor thermal measurement, management and modeling
Author
Siegal, Bernard S.
Author_Institution
Thermal Eng. Associates Inc., Mountain View, CA, USA
fYear
2003
fDate
11-13 March 2003
Firstpage
369
Lastpage
404
Abstract
This bibliography provides information on semiconductor thermal characteristics, measurement techniques and results, management techniques, hardware applications, modeling and computational techniques, and other pertinent information.
Keywords
bibliographies; computational fluid dynamics; integrated circuit measurement; integrated circuit modelling; integrated circuit packaging; semiconductor device measurement; semiconductor device models; semiconductor device packaging; thermal analysis; thermal management (packaging); thermal variables measurement; bibliography; semiconductor thermal characteristics; semiconductor thermal measurement techniques; thermal computational techniques; thermal management; thermal modeling; Bibliographies; Circuits; Electronic packaging thermal management; Microassembly; Microscopy; Plastics; Temperature measurement; Thermal conductivity; Thermal management; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 2003. Ninteenth Annual IEEE
ISSN
1065-2221
Print_ISBN
0-7803-7793-1
Type
conf
DOI
10.1109/STHERM.2003.1194387
Filename
1194387
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