Title :
Dead time measurement of closed loop system by wavelet
Author :
Tabaru, Tetsuya ; Shin, Seiichi
Author_Institution :
Univ. of Tokyo, Japan
Abstract :
This paper shows that the wavelet based dead time measurement method, which has been already studied for open loop systems. is also applicable to closed loop systems. The method uses a wavelet transform of a cross correlation function between an input and an output. To achieve our objective, we derive the wavelet transform for the. closed loop case.
Keywords :
closed loop systems; correlation methods; delays; wavelet transforms; closed loop systems; cross correlation function; wavelet based dead time measurement; wavelet transform; Closed loop systems; Delay effects; Fourier transforms; Linear systems; Open loop systems; Propagation delay; Time measurement; Wavelet analysis; Wavelet transforms; White noise;
Conference_Titel :
SICE 2002. Proceedings of the 41st SICE Annual Conference
Print_ISBN :
0-7803-7631-5
DOI :
10.1109/SICE.2002.1195804
