Title :
Measuring the width of transient pulses induced by ionising radiation
Author :
Nicolaidis, M. ; Perez, R.
Author_Institution :
iRoC Technol., Grenoble, France
fDate :
30 March-4 April 2003
Abstract :
This paper proposes a structure allowing measuring the duration of transient pulses induced in logic networks by ionizing particles and atmospheric neutrons. By providing accurate measurements of these pulses, the approach enables better understanding of the single-event-upset phenomenon, and allows an accurate evaluation of the SET sensitivity of modern VLSI circuits.
Keywords :
CMOS logic circuits; circuit simulation; field programmable gate arrays; integrated circuit measurement; integrated circuit reliability; integrated circuit testing; neutron effects; system-on-chip; transient analysis; FPGA emulator; SET sensitivity; SEU; SoC simulation; VDSM technologies; VLSI circuits; atmospheric neutrons; cell library characterization; ionising radiation; logic networks; single-event-upset phenomenon; transient pulse width measurement; Circuit faults; Circuit simulation; Ionizing radiation; Latches; Logic design; Neutrons; Protection; Pulse circuits; Pulse measurements; Space vector pulse width modulation;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
Print_ISBN :
0-7803-7649-8
DOI :
10.1109/RELPHY.2003.1197721
