Measuring the width of transient pulses induced by ionising radiation

Author

Nicolaidis, M. ; Perez, R.

Author_Institution

iRoC Technol., Grenoble, France

fYear

2003

fDate

30 March-4 April 2003

Firstpage

56

Lastpage

59

Abstract

This paper proposes a structure allowing measuring the duration of transient pulses induced in logic networks by ionizing particles and atmospheric neutrons. By providing accurate measurements of these pulses, the approach enables better understanding of the single-event-upset phenomenon, and allows an accurate evaluation of the SET sensitivity of modern VLSI circuits.

Keywords

CMOS logic circuits; circuit simulation; field programmable gate arrays; integrated circuit measurement; integrated circuit reliability; integrated circuit testing; neutron effects; system-on-chip; transient analysis; FPGA emulator; SET sensitivity; SEU; SoC simulation; VDSM technologies; VLSI circuits; atmospheric neutrons; cell library characterization; ionising radiation; logic networks; single-event-upset phenomenon; transient pulse width measurement; Circuit faults; Circuit simulation; Ionizing radiation; Latches; Logic design; Neutrons; Protection; Pulse circuits; Pulse measurements; Space vector pulse width modulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International

Print_ISBN

0-7803-7649-8

Type

conf

DOI

10.1109/RELPHY.2003.1197721

Filename

1197721