Title :
ESD challenges in magnetic recording: past, present and future
Author_Institution :
Maxtor Corp., Milpitas, CA, USA
fDate :
30 March-4 April 2003
Abstract :
The past, present and future ESD challenges in magnetic recording are reviewed. ESD damage mechanisms for the recording head are explained. It is shown that in the past 11 years, the ESD failure voltage for the recording head has decreased dramatically from its initial value of 15,000 VHBM to only 15 VHBM today. ESD control principles that focus on metal contact removal are discussed. It is concluded that ESD will continue to play an increasingly important role in the design, manufacture and handling of magnetic recording devices.
Keywords :
electric breakdown; electrostatic discharge; failure analysis; giant magnetoresistance; hard discs; magnetic heads; magnetic recording; magnetoresistive devices; AMR; ESD challenges; ESD control principles; ESD damage mechanisms; ESD failure voltage; GMR; TMR; electrical breakdown; hard disk drive; magnetic recording; metal contact removal; modified Paschen curve; recording head; Anisotropic magnetoresistance; Electric breakdown; Electrostatic discharge; Giant magnetoresistance; Hard disks; Magnetic heads; Magnetic recording; Manufacturing; Transducers; Transistors;
Conference_Titel :
Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International
Print_ISBN :
0-7803-7649-8
DOI :
10.1109/RELPHY.2003.1197749