Title : 
Active Guardband Management in Power7+ to Save Energy and Maintain Reliability
         
        
            Author : 
Lefurgy, Charles R. ; Drake, Alan J. ; Floyd, M.S. ; Allen-Ware, M.S. ; Brock, B. ; Tierno, Jose A. ; Carter, J.B. ; Berry, R.W.
         
        
        
        
        
        
        
        
            Abstract : 
Microprocessor voltage levels traditionally include substantial margin to ensure reliable operation despite variations in manufacturing, workload, and environmental parameters. This margin allows the microprocessor to function correctly during worst-case conditions, but during typical operation it is larger than necessary and wastes energy. The authors present a mechanism that reduces excess voltage margin by introducing a critical-path monitor (CPM) circuit that measures available timing margin in real time; coupling the CPM output to the clock generation circuit to rapidly adjust clock frequency in response to excess or inadequate timing margin; and adjusting the processor voltage level periodically in firmware to achieve a specified average clock frequency target. They first demonstrated this mechanism in an IBM Power7 server and proved its effectiveness in the Power7+ product. Power consumption on the VDD rail was reduced by 11 percent for SPEC CPU2006 workloads with negligible performance loss yet increased protection against noise events.
         
        
            Keywords : 
microprocessor chips; power aware computing; power consumption; CPM circuit; IBM Power7 server; Power7+ product; SPEC CPU2006 workload; active guardband management; critical-path monitor circuit; energy savings; microprocessor voltage level; power consumption; timing margin; Frequency control; Frequency measurement; Microprocessors; Program processors; Voltage control; Voltage measurement; Power7+; critical path; design; digital phase-lock loop; energy efficient; experimentation; measurement; performance; performance and reliability; reliability; timing margin; voltage speculation;
         
        
        
            Journal_Title : 
Micro, IEEE