Title :
THCMOS: testable high speed CMOS design
Author :
Rajsuman, R. ; Gupta, B.
Author_Institution :
Case Western Reserve University
Keywords :
CMOS technology; Circuit faults; Circuit testing; Current measurement; Electrical fault detection; FETs; Fault detection; Hardware; Logic testing; Robustness;
Conference_Titel :
Signals, Systems and Computers, 1989. Twenty-Third Asilomar Conference on
Print_ISBN :
0-929029-30-1
DOI :
10.1109/ACSSC.1989.1200825
