DocumentCode :
396273
Title :
Capacitance of abrupt one-sided InP/GaInAs heterojunctions
Author :
Sheinman, B. ; Sidorov, V. ; Ritter, D.
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
fYear :
2003
fDate :
12-16 May 2003
Firstpage :
138
Lastpage :
141
Abstract :
We demonstrate theoretically and experimentally that abrupt one-sided N-p+ heterojunctions behave like majority carrier diodes, in spite of the accumulation of minority carrier charge. Therefore, the diffusion capacitance should not be included in their equivalent circuit. An important result is that the base-emitter junction capacitance of abrupt heterojunction bipolar transistors can be precisely measured at high forward bias. An additional conclusion is that Schottky diodes can be replaced by abrupt heterojunctions, which have superior noise performance, and lower leakage current.
Keywords :
III-V semiconductors; equivalent circuits; gallium arsenide; heterojunction bipolar transistors; indium compounds; leakage currents; minority carriers; semiconductor device noise; InP-GaInAs; abrupt heterojunction bipolar transistors; abrupt one-sided InP/GaInAs heterojunctions; base-emitter junction capacitance; diffusion capacitance; equivalent circuit; high forward bias; lower leakage current; majority carrier diodes; minority carrier charge accumulation; noise performance; Admittance; Capacitance; Circuits; Equations; Frequency; Heterojunctions; Indium phosphide; Schottky diodes; Semiconductor diodes; Thermionic emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 2003. International Conference on
Print_ISBN :
0-7803-7704-4
Type :
conf
DOI :
10.1109/ICIPRM.2003.1205332
Filename :
1205332
Link To Document :
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