DocumentCode :
396281
Title :
Ultrafast recovery times and increased absorption nonlinearity in InGaAsP MQW saturable absorbers implanted at 200°C
Author :
Pantouvaki, M. ; Gwilliam, R. ; Burr, E.P. ; Krysa, A.B. ; Roberts, J.S. ; Seeds, A.J.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. Coll. London, UK
fYear :
2003
fDate :
12-16 May 2003
Firstpage :
355
Lastpage :
358
Abstract :
Implantation of an InGaAsP MQW structure with 4 MeV N-ions at room temperature and at 200°C results in absorption recovery times < 10 ps. High-temperature implantation improves the post-implantation absorption modulation by up to 20%, due to dynamic annealing. This makes implantation at high temperature an interesting technique for the fabrication of ultrafast non-linear optical devices.
Keywords :
III-V semiconductors; annealing; gallium arsenide; high-speed optical techniques; indium compounds; ion implantation; optical saturable absorption; semiconductor quantum wells; 10 ps; 200 degC; 4 MeV; InGaAsP MQW saturable absorbers; InGaAsP:N; N ion implantation; absorption recovery times; dynamic annealing; high temperature; high-temperature implantation; increased absorption nonlinearity; post-implantation absorption modulation; room temperature; ultrafast nonlinear optical devices; ultrafast recovery times; Absorption; Annealing; Distributed Bragg reflectors; Indium phosphide; Nonlinear optics; Plasma temperature; Quantum well devices; Substrates; Synthetic aperture sonar; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 2003. International Conference on
Print_ISBN :
0-7803-7704-4
Type :
conf
DOI :
10.1109/ICIPRM.2003.1205388
Filename :
1205388
Link To Document :
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