Title :
A current-mode VLSI architecture for skin detection
Author :
Boussaid, Farid ; Chai, Douglas ; Bouzerdoum, Abdesselam
Author_Institution :
Sch. of Eng. & Math., Edith Cowan Univ., Perth, WA, Australia
Abstract :
A current-mode VLSI architecture enabling real-time skin detection processing is presented. Based on a statistical skin color model, it achieves pixel classification on readout in the normalized RGB color space. A single processing unit is used to classify all pixels of the input RGB image. This results in reduced mismatch associated errors and in an increased pixel fill-factor. Furthermore, the proposed current-mode architecture is programmable, allowing for the external control of all classifier parameters to compensate for mismatch and changing lighting conditions.
Keywords :
VLSI; image classification; image colour analysis; image segmentation; skin; statistical analysis; RGB color space; classifier parameter; current-mode VLSI architecture; pixel classification; pixel fill-factor; real-time skin detection processing; single processing unit; statistical skin color; Chromium; Covariance matrix; Equations; Image segmentation; Interpolation; Pixel; Probability density function; Skin; Testing; Very large scale integration;
Conference_Titel :
Signal Processing and Its Applications, 2003. Proceedings. Seventh International Symposium on
Print_ISBN :
0-7803-7946-2
DOI :
10.1109/ISSPA.2003.1224782