Title :
High reliability BGA package improvements on module total cost of ownership
Author :
Alcoe, David J. ; Blackwell, Kim J. ; Rai, Rajinder
Author_Institution :
Endicott Interconnect Technol., Inc., NY, USA
Abstract :
This paper describes mechanical reliability and relative cost comparisons from the system ownership point of view. Total system cost performance of a PTFE based organic ball grid array chip package is compared, on a relative basis, to that obtained with other BGA packages having organic as well as ceramic technologies. Mechanical reliability performance values obtained in common reliability testing are projected to field usage performance, and compared across these various package types. The paper discusses the results for large body sizes and large die sizes, where interesting trends are noted. Considering the various package types and sizes, this study identifies primary assembly (to printed wiring board) costs, on a relative basis, including standard BGA assembly, land grid array with sockets, and column grid array. Combining this assembly data with package reliability projections, a simple guide is provided for the total cost of ownership over a period of time. Further refinement, including system availability and service costs, is discussed.
Keywords :
ball grid arrays; ceramic packaging; costing; reliability; BGA packages; ceramic technologies; column grid array; land grid socket array; mechanical reliability; organic ball grid array chip; package reliability; reliability testing; Assembly systems; Ceramics; Copper; Costs; Electronic packaging thermal management; Electronics packaging; Flip chip; Semiconductor device packaging; Steel; Wiring;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2003. IEMT 2003. IEEE/CPMT/SEMI 28th International
Print_ISBN :
0-7803-7933-0
DOI :
10.1109/IEMT.2003.1225914