DocumentCode :
397224
Title :
Safe probe for high electric field measurements
Author :
Barthod, C. ; Passard, M. ; Galez, C. ; Bouillot, J. ; Farzaneh, Masoud ; Volat, C. ; Teisseyre, Y.
Author_Institution :
Laboratoire d´´Instrumentation et de Materiaux, Savoie Univ., Annecy Cedex, France
Volume :
1
fYear :
2003
fDate :
4-7 May 2003
Firstpage :
635
Abstract :
The present study concerns an optical electric field measuring device using a lithium niobate (LiNbO3) crystal as sensing medium, without any contacting electrode. Such a device has the advantage of providing a good galvanic insulation of materials and persons. A likely application is electric field measurement near electric power installations (frequency 50-60 Hz). The principle of measurement implements the electro-optical effect in the crystals and results from the way in which polarized light is analyzed after going through the crystal. Experimental setups have been developed in order to both validate the physical principle, and calibrate the probe. Simulations of this device with the finite element method being in good agreement with experiment, the implementation of the probe in the foreseen environment are studied. Then, a probe prototype, for which measurement can be realized far away with optical fibers, is performed. Simulated and experimental results near electric power installations are discussed. The results obtained using the prototype are very promising so far.
Keywords :
electric field measurement; electro-optical effects; finite element analysis; lithium compounds; niobium compounds; probes; 50 to 60 Hz; LiNbO3; contacting electrode; electric field measurements; electric power installations; electro-optical effect; finite element method; galvanic insulation; lithium niobate crystal; optical electric field measuring device; optical fibers; polarized light; sensing medium; Crystalline materials; Electric variables measurement; Electrodes; Galvanizing; Insulation; Lithium niobate; Optical devices; Optical sensors; Probes; Prototypes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2003. IEEE CCECE 2003. Canadian Conference on
ISSN :
0840-7789
Print_ISBN :
0-7803-7781-8
Type :
conf
DOI :
10.1109/CCECE.2003.1226475
Filename :
1226475
Link To Document :
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