• DocumentCode
    397224
  • Title

    Safe probe for high electric field measurements

  • Author

    Barthod, C. ; Passard, M. ; Galez, C. ; Bouillot, J. ; Farzaneh, Masoud ; Volat, C. ; Teisseyre, Y.

  • Author_Institution
    Laboratoire d´´Instrumentation et de Materiaux, Savoie Univ., Annecy Cedex, France
  • Volume
    1
  • fYear
    2003
  • fDate
    4-7 May 2003
  • Firstpage
    635
  • Abstract
    The present study concerns an optical electric field measuring device using a lithium niobate (LiNbO3) crystal as sensing medium, without any contacting electrode. Such a device has the advantage of providing a good galvanic insulation of materials and persons. A likely application is electric field measurement near electric power installations (frequency 50-60 Hz). The principle of measurement implements the electro-optical effect in the crystals and results from the way in which polarized light is analyzed after going through the crystal. Experimental setups have been developed in order to both validate the physical principle, and calibrate the probe. Simulations of this device with the finite element method being in good agreement with experiment, the implementation of the probe in the foreseen environment are studied. Then, a probe prototype, for which measurement can be realized far away with optical fibers, is performed. Simulated and experimental results near electric power installations are discussed. The results obtained using the prototype are very promising so far.
  • Keywords
    electric field measurement; electro-optical effects; finite element analysis; lithium compounds; niobium compounds; probes; 50 to 60 Hz; LiNbO3; contacting electrode; electric field measurements; electric power installations; electro-optical effect; finite element method; galvanic insulation; lithium niobate crystal; optical electric field measuring device; optical fibers; polarized light; sensing medium; Crystalline materials; Electric variables measurement; Electrodes; Galvanizing; Insulation; Lithium niobate; Optical devices; Optical sensors; Probes; Prototypes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2003. IEEE CCECE 2003. Canadian Conference on
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-7781-8
  • Type

    conf

  • DOI
    10.1109/CCECE.2003.1226475
  • Filename
    1226475