Riding the relational power wave to enhance the command, control & prompt reduction of monitoring wafer usage

The paper presents a method (named as the "Power" Concept) which quantifies the controlling & management of the necessary but relentingly high Monitor Wafer usages in the Wafer Fab. The objective is effective & prompt wafer usage reduction without losing the command and control of the wafers quantity & quality. This approach establishes the understanding & quantification on the impact of each well-intentioned input action taken. Quantifications are achieved by \´adding direction\´ to the Input Power(P), and thus riding and tapping on this Power(P) & not be overwhelmed by the problems of uncontrolled Power(P). Quantifiable anticipated results are the characteristics of this approach.