DocumentCode :
39770
Title :
A Stochastic Sensor Selection Scheme for Sequential Hypothesis Testing With Multiple Sensors
Author :
Cheng-Zong Bai ; Katewa, Vaibhav ; Gupta, Vijay ; Yih-Fang Huang
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
Volume :
63
Issue :
14
fYear :
2015
fDate :
15-Jul-15
Firstpage :
3687
Lastpage :
3699
Abstract :
We study the problem of binary sequential hypothesis testing using multiple sensors with associated observation costs. An off-line randomized sensor selection strategy, in which a sensor is chosen at every time step with a given probability, is considered. The objective of this work is to find a sequential detection rule and a sensor selection probability vector such that the expected total observation cost is minimized subject to constraints on reliability and sensor usage. First, the sequential probability ratio test is shown to be the optimal sequential detection rule in this framework as well. Efficient algorithms for obtaining the optimal sensor selection probability vector are then derived. In particular, a special class of problems in which the algorithm has complexity that is linear in the number of sensors is identified. An upper bound for the average sensor usage to estimate the error incurred due to Wald´s approximations is also presented. This bound can be used to set a safety margin for guaranteed satisfaction of the constraints on the sensor usage.
Keywords :
approximation theory; reliability; sensor fusion; Wald approximations; binary sequential hypothesis testing; multiple sensors; observation costs; off-line randomized sensor selection strategy; optimal sensor selection probability vector; reliability; safety margin; sensor selection probability vector; sensor usage; sequential detection rule; sequential hypothesis testing; sequential probability ratio test; stochastic sensor selection scheme; Approximation algorithms; Approximation methods; Random sequences; Reliability; Safety; Signal processing algorithms; Testing; Hypothesis testing; SPRT; sensor scheduling; sensor selection; sequential detection; sequential probability ratio test;
fLanguage :
English
Journal_Title :
Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1053-587X
Type :
jour
DOI :
10.1109/TSP.2015.2425804
Filename :
7093177
Link To Document :
بازگشت