DocumentCode :
397867
Title :
Hidden Markov Models to identify pilot instrument scanning and attention patterns
Author :
Hayashi, Miwa
Author_Institution :
Dept. of Aeronaut. & Astronaut., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume :
3
fYear :
2003
fDate :
5-8 Oct. 2003
Firstpage :
2889
Abstract :
A previous study successfully demonstrated the potential usefulness of Hidden Markov Model (HMM) analysis techniques in analyzing pilots\´ eye-movement data to detect differences in scanning and attention patterns caused by display format changes. This paper focuses on assessing differences among pilots using the same display format. A flight simulator experiment was conducted with four pilots who had different levels of flight expertise. The analysis revealed variations in the HMM structures during the final descent segment: a 2-state HMM for the patterns of the least experienced pilot, a 3-state HMM for the two intermediate-level pilots, and a 4-state HMM for the most experienced pilot. The added "attitude-monitoring" state in the 4-state HMM reflected a flight technique well-known among experienced instrument pilots. HMM analysis methodology and interpretation issues are also discussed.
Keywords :
aerospace simulation; hidden Markov models; image scanners; 2 state HMM; 3 state HMM; 4 state HMM; attention patterns; attitude monitoring state; display format; flight simulator; hidden Markov models; pilot eye movement data; pilot instrument scanning; Aircraft; Bandwidth; Data analysis; Displays; Hidden Markov models; Humans; Instruments; Pattern analysis; Resource management; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man and Cybernetics, 2003. IEEE International Conference on
ISSN :
1062-922X
Print_ISBN :
0-7803-7952-7
Type :
conf
DOI :
10.1109/ICSMC.2003.1244330
Filename :
1244330
Link To Document :
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