Title :
3D fast ridgelet transform
Author :
Carré, Philippe ; Helbert, David ; Andres, Eric
Author_Institution :
IRCOM-SIC Lab., Futuroscope, France
Abstract :
In this paper, we present a fast implementation of the 3D ridgelet transform based on discrete analytical 3D lines: the 3D discrete analytical ridgelet transform (DART). This transform uses the Fourier strategy (the projection-slice formula) for the computation of the associated discrete Radon transform. The innovative step of the DART is the construction of 3D discrete analytical lines in the Fourier domain, that allows a fast perfect backprojection. These discrete analytical lines have a parameter called arithmetical thickness, allowing us to define a DART adapted to a specific application. A denoising application is presented.
Keywords :
Fourier transforms; Radon transforms; image denoising; image reconstruction; wavelet transforms; 3D discrete analytical line construction; 3D discrete analytical ridgelet transform; Fourier domain; arithmetical thickness; denoising application; discrete Radon transform; fast perfect backprojection; projection-slice formula; Discrete Fourier transforms; Discrete transforms; Discrete wavelet transforms; Fourier transforms; Interpolation; Laboratories; Lattices; Wavelet analysis; Wavelet domain; Wavelet transforms;
Conference_Titel :
Image Processing, 2003. ICIP 2003. Proceedings. 2003 International Conference on
Print_ISBN :
0-7803-7750-8
DOI :
10.1109/ICIP.2003.1247139
